JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, ...

What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...

As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult to contact and measure microscale circuits using nano-manipulators. In addition, contact ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026.

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Ion milling is a highly effective sample preparation technique that provides professionals across various industries and academic fields with valuable insights into complex microscale structures, ...

Electron Backscatter Diffraction (EBSD), a scanning electron microscope (SEM)-based method, is widely used for microstructural characterization of materials. EBSD is a surface method that involves ...

JEOL Ltd. has launched HAXIS, a new low-angle ion-milling scanning electron microscope for semiconductor failure analysis, ...

JEOL (TSE:6951) has introduced its HAXIS low angle ion milling scanning electron microscope to the market, targeting semiconductor failure analysis workflows that rely on precise, repeatable defect ...